Ion Beam Stability Prediction of ECR Ion Source Based on TCN-DTW Network

R. Wang,C. Qian,L. T. Sun,Y. H. Guo, Z. G. Cao, M. Y. Hou

JOURNAL OF INSTRUMENTATION（2024）

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关键词

Accelerator Applications,Ion sources (positive ions,negative ions,electron cyclotron resonance (ECR),electron beam (EBIS)),Data processing methods

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