Single-shot Experiments at the Soft X-FEL FERMI Using a Back-Side-illuminated Scientific CMOS Detector. CorrigendumCyril Léveillé,K. Desjardins,H. Popescu,B. Vodungbo,M. Hennes,R. Delaunay,E. Jal,D. De Angelis,M. Pancaldi,E. Pedersoli,F. Capotondi,N. JaouenJournal of Synchrotron Radiation（2022）引用 0|浏览0AI 理解论文溯源树样例生成溯源树，研究论文发展脉络Chat Paper正在生成论文摘要
