Turn on, Tune in, Listen up: Maximizing Side-Channel Recovery in Cross-Platform Time-to-Digital Converters

Voltage fluctuation sensors measure minute changes in an FPGA power distribution network, allowing attackers to extract information from concurrently executing computations. Previous voltage fluctuation sensors make assumptions about the co-tenant computation and require the attacker have a priori access or system knowledge to tune the sensor parameters statically. Additionally, prior voltage fluctuation sensors make use of proprietary vendor intellectual property and do not provide guidance on sensor migration to other vendors. We present the open-source design of the Tunable Dual-Polarity Time-to-Digital Converter, which introduces three dynamically tunable parameters that optimize signal measurement, including the transition polarity, sample window, frequency, and phase. We show that a properly tuned sensor improves co-tenant classification accuracy by 2.5 \(\times\) over prior work and increases the ability to identify the co-tenant computation and its microarchitectural implementation. Across 13 varying applications, our techniques yield an 80 \(\%\) classification accuracy that generalizes beyond a single board. Our sensor improves the ability of a correlation power analysis attack to rank correct subkey values by 2 \(\times\). As an extension to our prior work, we show that the voltage fluctuation sensor is portable to multiple FPGA vendors, and we demonstrate implementations on both Xilinx and Intel FPGA systems.