An intelligent spraying system for weeds in wheat fields based on a dynamic model of droplets impacting wheat leaves.

Introduction:Targeted herbicide application refers to precise application of herbicides in weed-infested areas according to the location and density of farmland weeds. At present, targeted herbicide application in wheat fields generally faces problems including the low herbicide adhesion rate, leading to omission and excessive loss of herbicides. Methods:To solve these problems, changes in the impact force of herbicide and the weed leaves in the operation process of a spraying system were studied from the interaction between weeds and herbicides applied. A dynamic model of weed leaves was established. On this basis, the research indicated that the herbicide adhesion rate is highest under spraying pressure of 0.4 MPa and flow rate of 0.011 kg/s when the spray height is 300 mm. To study the dynamic deformation of weed leaves and the distribution of liquid herbicides in the external flow field under weed-herbicide interaction, a dynamic simulation model of herbicide application was built using the finite element method. Results and Discussion:The results show that when the spray height is 300 mm, the maximum weed leaf deformation index (LDI) is 0.43 and the velocity in the external flow field is 0 m/s under spraying pressure of 0.4 MPa and flow rate of 0.011 kg/s. This finding indicates that the herbicide is not splashed elsewhere and the turbulence intensity in the weed area is 2%, implying steady flow of the herbicide, most of which can be retained on weed leaves. Field test results of application quality of the herbicide show that the maximum LDI is 0.41 and the coverage of the herbicide in the sheltered area below the leaves is 19.02% when the spraying pressure is 0.4 MPa, flow rate is 0.011 kg/s, and spray height is 300 mm. This solves the problem of a low rate of utilization of herbicides because the herbicide passes through weed plants, and achieves the precision herbicide application in wheat fields.