Quantitative determination of twist angle and strain in Van der Waals moiré superlattices
arxiv(2024)
Abstract
Scanning probe techniques are popular, non-destructive ways to visualize the
real space structure of Van der Waals moirés. The high lateral spatial
resolution provided by these techniques enables extracting the moiré lattice
vectors from a scanning probe image. We have found that the extracted values,
while precise, are not necessarily accurate. Scan-to-scan variations in the
behavior of the piezos which drive the scanning probe, and thermally-driven
slow relative drift between probe and sample, produce systematic errors in the
extraction of lattice vectors. In this Letter, we identify the errors and
provide a protocol to correct for them. Applying this protocol to an ensemble
of ten successive scans of near-magic-angle twisted bilayer graphene, we are
able to reduce our errors in extracting lattice vectors to less than 1
translates to extracting twist angles with a statistical uncertainty less than
0.001 and uniaxial heterostrain with uncertainty on the order of 0.002
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