Analysis of TCC in P-N Short Silicon Diodes at 300–400 K
IEEE Transactions on Electron Devices（2024）
关键词
Silicon,Semiconductor diodes,Temperature sensors,Charge carriers,Current density,Analytical models,Semiconductor process modeling,Analytical model (AM),p-n-diode,short diode,silicon,technology computer-aided design (TCAD),temperature coefficient of current (TCC),thermal sensitivity,thermal sensors
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