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Morphotropic Phase Boundary-Enhanced Polarization and High-Temperature Retention in Ferroeletric FET

Y. -T. Tang, C. -S. Pai, Z. -R. Haung, Y. -T. Tsai, Z. -K. Chen

2024 INTERNATIONAL VLSI SYMPOSIUM ON TECHNOLOGY, SYSTEMS AND APPLICATIONS, VLSI TSA(2024)

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Key words
High-temperature Retention,Heat Transfer,Superlattice,Edge Devices,Electrical Measurements,Charge Trapping,Gate Stack
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