Hybrid Photoelectron Momentum Microscope at the Soft X-ray Beamline I09 of the Diamond Light Source
arxiv(2024)
摘要
Soft X-ray momentum microscopy of crystalline solids is a highly efficient
approach to map the photoelectron distribution in four-dimensional (E,k)
parameter space over the entire Brillouin zone. The fixed sample geometry
eliminates any modulation of the matrix element otherwise caused by changing
the angle of incidence. We present a new endstation at the soft X-ray branch of
beamline I09 at the Diamond Light Source, UK. The key component is a large
single hemispherical spectrometer combined with a time-of-flight analyzer
behind the exit slit. The photon energy ranges from hv = 105 eV to 2 keV, with
circular polarization available for hv > 150 eV, allowing for circular
dichroism measurements in angle-resolved photoemission (CD-ARPES). A focused
and monochromatized He lamp is used for offline measurements. Under k-imaging
conditions, energy and momentum resolution are 10.2 meV (FWHM) and 0.010
angstroms^-1 (base resolution 4.2 meV with smallest slits and a pass energy of
8 eV). The large angular filling of the entrance lens and hemisphere (225 mm
path radius) allows k-field-of-view diameters > 6 angstroms^-1. Energy filtered
X-PEEM mode using synchrotron radiation revealed a resolution of 300 nm. As
examples we show 2D band mapping of bilayer graphene, 3D mapping of the Fermi
surface of Cu, CD-ARPES for intercalated indenene layers and the sp valence
bands of Cu and Au, and full-field photoelectron diffraction patterns of Ge.
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