Effects of Parasitic Elements on L-Type LC/CL Matching Circuits. Satoshi Tanaka,Takeshi Yoshida,Minoru FujishimaIEICE Trans. Fundam. Electron. Commun. Comput. Sci.(2024)引用 0|浏览0暂无评分AI 理解论文溯源树样例生成溯源树,研究论文发展脉络Chat Paper正在生成论文摘要