A Novel Approach for Doping Two-Dimensional MOS2 Materials: ZNO Polar Interfacial Charge Transfer Method
2024 Conference of Science and Technology for Integrated Circuits (CSTIC)(2024)
摘要
The performance of monolayer Mos2 devices is restricted by low carrier density and contact resistivity. It is crucial to discover a new doping technology to overcome these limitations. In this study, we have devised a novel approach for doping Mos2. By utilizing the ZnO polarity of the different elements interface, Mos2 can be doped with n/p doping. We also constructed a dual-ended device and found that this method indeed increased the intrinsic current at 4.5nm by 10
6
times.
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关键词
Contact Resistance,Carrier Density,Interface Elements,Low Carrier Density,Band Gap,Density Functional Theory,Charge Density,Heterostructures,Band Structure,Fermi Level,Spacer Region,Generalized Gradient Approximation,Charge Accumulation,Fermi Dirac,Device Model,Device Resistance,Doped Materials,Charge Density Difference,Electron Accumulation,Top Gate,Doping Method,Non-equilibrium Green’s Function,ZnO Surface,Charge Depletion
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