Strain-induced Shape Transition of VSi2 Clusters on Si(111)

V.J.S. Oldenktotte, S.E. Vries, M.A. Smithers,K. Sotthewes,H.J.W. Zandvliet

Thin Solid Films(2024)

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摘要
We investigated the growth and shape of vanadium silicide clusters on Si(111) using scanning tunneling microscopy, atomic force microscopy and scanning electron microscopy. The deposition of 8 monolayers of vanadium on Si(111) and subsequent annealing at 1200 K leads to the formation of large elongated VSi2 clusters. This is in marked contrast to the deposition of submonolayer amounts of V where the VSi2 islands have a compact shape. The shape transition can be explained by a competition between edge formation and strain relaxation energy terms. The VSi2 clusters, which are aligned along the three high symmetry directions of the Si(111) surface and surrounded by a denuded zone, form a two-dimensional network.
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关键词
Vanadium,Si(111),Silicide,Epitaxy,Strain,Shape transition,Scanning tunneling microscopy,Atomic force microscopy,Scanning electron microscopy
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