Open-Set Specific Emitter Identification Leveraging Enhanced Metric Denoising Auto-Encoders

IEEE Internet of Things Journal(2024)

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Abstract
Specific Emitter Identification (SEI) is pivotal for ensuring the security of the Internet of Things (IoT). Traditional deep learning-based SEI techniques often falter in real-world applications, particularly when distinguishing between legitimate and rogue devices amid noisy conditions and low Signal-to-Noise Ratios (SNR). To surmount these challenges, we propose a novel open-set SEI (OS-SEI) strategy that utilizes a Metric-enhanced Denoising Auto-encoder (MeDAE) architecture. This advanced framework incorporates a deep residual shrinkage network, significantly augmenting the denoising autoencoder’s capability, thereby bolstering its resilience against noisy environments. Further, the integration of discriminative metrics, such as center loss, markedly enhances feature discrimination, resulting in heightened accuracy of device identification. Our comprehensive experimental assessments, conducted on an Automatic Dependent Surveillance-Broadcast (ADS-B) dataset, underscore the superiority of our proposed OS-SEI method over existing models. The findings confirm our approach’s enhanced robustness to noise and its superior accuracy in device identification within open-set scenarios.
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Key words
Specific emitter identification,deep learning,deep metric learning,denoising autoencoder,open-set,noise robustness
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