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A Four-Port Noise De-Embedding Methodology for On-Wafer Microwave Device Based on Electromagnetic Simulation

Zhiyu Feng, Wucang Ding,Yongbo Su,Ruize Feng,Fugui Zhou, Hang Gong,Zhi Jin

IEEE Microwave and Wireless Technology Letters（2024）

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Key words
Electromagnetic (EM) simulation,four-port de-embedding,InP HEMT,noise de-embedding,noise parameters
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