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Vmin Shift Prediction Using Machine Learning-Based Methodology for Automotive Products

Y. L. Yang,P. C. Tsao, C. W. Lin, H. Q. Chen, B. J. Huang, Hank Hsieh, Kerwin Chen, Ross Lee, Khim Koh, Y. J. Ting, B. C. Hsu, Y. S. Huang,Citi Lai, M. Z. Lee, T. H. Lee

2024 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM, IRPS 2024（2024）

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关键词
Machine Learning,Vmin shift,aging monitor,datacenter,automotive
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