Utilizing Transformer Deep Learning Based Outlier Detection to Screen out Reliability Weak ICs

C. W. Lin,P. C. Tsao, Y. L. Yang, C. C. Sun, C. C. Huang, C. W. Chen, C. K. Chang, Y. J. Ting, K. Koh, Ross Lee, W. C. Chen, Y. S. Huang, M. Z. Lee,C. T. Lai, T. H. Lee

2024 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM, IRPS 2024（2024）

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Key words

Automotive,Outlier detection,Transformer,Deep learning,Machine learning,DPPM

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