Self-Heating and Process-Induced Threshold Voltage Aware Reliability and Aging Analysis of Forksheet FET
2024 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM, IRPS 2024（2024）
Key words
Forksheet FET,Self-heating Effect,Variability analysis,Reliability analysis,Lifetime prediction
AI Read Science
Must-Reading Tree
Example
Generate MRT to find the research sequence of this paper
Chat Paper
Summary is being generated by the instructions you defined