Virtual FA Methodology for DRAM: Real-Time Analysis and Risk Assessment Method Using Telemetry

Jungchul Lee, E. C. Kwon, S. H. Yoon, R. G. Oh, S. Y. Park,S. H. Youn,K. R. Choi, T. W. Kim, M. C. Kim,J. H. Park,Y. W. Ko, Y. D. Kim,J. S. Moon,H. A. Park,K. O. Hong, J. Y. Yang, J. Y. Yoon,J. M. Yoon, J. M. Lee, J. H. Kim,H. Y. Yoo, S. J. Kim,N. H. Lee, S. H. Lee,K. S. Kwon,I. G. Jung,Y. S. Lee,Sangwoo Pae

2024 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM, IRPS 2024（2024）

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Key words

DRAM failure,failure analysis,quality,system reliability,virtual

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