Design of Physically Unclonable Function Using Ferroelectric FET with Auto Write-Back Technique for Resource-Limited IoT Security
IEEE INTERNET OF THINGS JOURNAL（2024）
Key words
FeFETs,Nonvolatile memory,Internet of Things,Security,Circuit stability,Encryption,Microprocessors,Auto write-back,cell area,ferroelectric field-effect transistor (FeFET),low power,nonvolatile memory (NVM),physically unclonable function (PUF),process variation,stability
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