Research on Testing Methods for Memory Data Abnormal Bit Flipping of Relay Protection Devices Under Radiation Impact

During operation, relay protection devices may be subjected to radiation from high-energy particles in the ground environment, resulting in memory data abnormal bit upset. This leads to the loss of critical data, abnormal program operation, functional failure, and incorrect operation of relay protection devices. This paper first analyzes the fault excitation mechanism and fault characteristics of memory data abnormal bit flipping in relay protection devices under radiation impact. Secondly, a flexible and portable software implement faults injection testing method for memory data abnormal bit flipping was designed. This is achieved through three steps: establishing a fault injection model, building a fault injection testing system, and conducting fault injection testing experiments. Finally, the testing method proposed in the paper was validated through experiments, proving its practicality and feasibility.