Electrical Performance and Reliability Analysis of Vertical Gan Schottky Barrier Diodes with Dual-Ion Implanted Edge TerminationBo Li, Huakai Yang, Linfei Gao, Zhengweng Ma, Jinpei Lin, Zhihao Wu,Hsien-Chin Chiu,Hao-Chung Kuo,Chunfu Zhang,Zhihong Liu,Shuangwu Huang,Wei He,Xinke Liucrossref（2024）引用 0|浏览0暂无评分AI 理解论文溯源树样例生成溯源树，研究论文发展脉络Chat Paper正在生成论文摘要
