A review on 3D measurement of highly reflective objects using structured light projection

The three-dimensional(3D) measurement technology based on structured light fringe projection has the advantages of high efficiency, simplicity and non-contact acquisition. However, its measurement quality is heavily dependent on the reflective properties of the target surface. For a highly reflective surface, overexposure may be caused in some areas of the image, bringing decoding errors and causing the degradation of accuracy or even measurement failure. In recent years, a lot of researches have been done on this problem and many methods have been proposed. However, a systematic survey of these methods is still lacking. In this work, a review of the structured light 3D measurement techniques for highly reflective surfaces is presented. Firstly, the challenges posed by surface reflectivity to structured light 3D measurement are analyzed. Secondly, recent methods, which are classified into two categories, are reviewed. Finally, the accuracy and efficiency of these methods are discussed, and the trends of future researches are summarized.