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Enhanced Stability in InSnO Transistors Via Ultrathin In-Situ AlOx Passivation

Jiabing Li,Yayi Chen,Qingguo Gao,Tianfan Cao, Junxi Ma, Da Li, Likun Zheng,Xinjian Pan,Jianjun Yang,Ping Liu,Yuan Liu,Liming Liu

APPLIED SURFACE SCIENCE（2024）

Cited 0|Views28
Key words
In-situ AlOx passivation,Low-frequency noise,Positive/negative bias stress,Ultrathin indium tin oxide transistors
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