X-ray Induced Electric Currents in Anodized Ta2O5: Towards a Large-Area Thin-Film Sensor.

PURPOSE:We investigated the characteristics of radiation-induced current in nano-porous pellet and thin-film anodized tantalum exposed to kVp X-ray beams. We aim at developing a large area (≫cm2) thin-film radiation sensor for medical, national security and space applications. METHODS:Large area (few cm2) micro-thin Ta foils were anodized and coated with a counter electrode made of conductive polymer. In addition, several types of commercial electrolytic porous tantalum capacitors were assembled and prepared for irradiation with kVp X-rays. We measured dark current (leakage) as well as transient radiation-induced currents as a function of external voltage bias. RESULTS:Large transient currents (up to 50 nA) under X-ray irradiation (dose rate of about 3 cGy/s) were measured in Ta2O5 capacitors. Small nano-porous Ta and large-area flat Ta foil capacitors show similar current-voltage characteristic curve after accounting for different X-ray attenuation in capacitor geometry. The signal is larger for thicker capacitor oxide. A non-negligible signal for null external voltage bias is observed, which is explained by fast electron production in Ta foils. CONCLUSIONS:Anodized tantalum is a promising material for use in large-area, self-powered radiation sensors for X-ray detection and for energy harvesting.