LLM-Powered Test Case Generation for Detecting Tricky BugsKaibo Liu,Zhenpeng Chen,Yiyang Liu,Jie M. Zhang, Mark Harman,Yudong Han,Yun Ma, Yihong Dong,Ge Li,Gang HuangCoRR(2024)引用 0|浏览103关键词LDMOS Design,Stink Bug,TLP CalibrationAI 理解论文溯源树样例生成溯源树,研究论文发展脉络Chat Paper正在生成论文摘要