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An Improved Methodology for High-Resolution LA-ICP-MS Trace-Element Fingerprinting of Tephra Layers: Insights from the Upper and Lower Nariokotome Tuffs, Turkana Basin, Kenya

CHEMICAL GEOLOGY(2024)

引用 0|浏览18
关键词
Tephra,LA-ICP-MS,Trace elements,Precision,Tephrochronology,Tephra ‘Fingerprinting’,East African Rift System
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