X-ray focusing below 3 nm with aberration-corrected multilayer Laue lensesJ. Lukas Dresselhaus,Margarita Zakharova,Nikolay Ivanov,Holger Fleckenstein,Mauro Prasciolu,Oleksandr Yefanov,Chufeng Li,Wenhui Zhang,Philipp Middendorf, Dmitry Ergov, Ivan de Gennaro Aquino,Henry Chapman,Saša BajtOptics Express(2024)引用 0|浏览2暂无评分AI 理解论文溯源树样例生成溯源树,研究论文发展脉络Chat Paper正在生成论文摘要