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Microstructural and Current-voltage Characteristics in Mo/HfO2/n‑Si Based Metal-Insulator-Semiconductor (MIS) Diode using Different Methods for Optoelectronic Device Applications

G. Nagaraju -,N.V. Srihari -,M. Vani -,R. Jaya Madhuri -,V. Manjunath -, M. Renuka -, B. Rajitha -, Saripiralla Basamma -,S. Himagirish Kumar -,P. R. Sekhar Reddy -

International Journal For Multidisciplinary Research（2024）

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