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Reliability Run and Data Analysis of the Accelerated Aging of Present and Future Electrolytic Capacitors Installed in the Protection Systems of Superconducting Magnets of the Large Hadron Collider at CERN

J. Guasch-Martinez, D. Carrillo, E. de Nicolas, E. Bjorkhaug,E. Nowak,M. Pojer,F. Rodriguez-Mateos

JOURNAL OF INSTRUMENTATION(2024)

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Key words
Analysis and statistical methods,Data analysis,Detection of defects,Manufacturing
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