Evolution of static recrystallization microstructure caused by residual strain of an Al-richen Ni-based single crystal superalloy

Recrystallization has a devastating effect on the service process of single crystal superalloys (SX). This study mainly investigated the static recrystallization (SRX) behavior of an as-cast high Al content nickel-based SX under local or global deformation at room temperature, as well as heat treatment at various temperatures. The microstructural evolution was observed under different conditions using electron back scatter diffraction (EBSD), which was employed to determine the SRX threshold. The results indicated that the critical SRX temperature exceeds 1260 degrees C, and the critical plastic strain is greater than 5 %. In particular, the characteristic of the higher SRX tendency in the interdendritic region (IDR) of the as-cast SX was discovered, which was attributed to the phenomenon that the IDR with lower deformation resistance was prone to significant plastic accumulation and the bulk gamma' could be the nucleation substrate of the SRX. Furthermore, with the increase in heat treatment temperature, there are certain changes in the morphology characteristics of re-precipitated gamma' in the vicinity of the SRX grain boundary with a higher migration rate. This is mainly attributed to the decrease in the internal subcooling of the bulk gamma' phase and the increase in the concentration of gamma' forming elements at the grain boundary front.