Noise Robust Reservoir Computing Based on Flexible Doped Hafnium Oxide Memcapacitors

Qianye Xing,Mengjiao Pei, Lesheng Qiao,Baocheng Peng, Kailu Shi, Xiao Fang,Hangyuan Cui,Changjin Wan, Qing Wan

IEEE TRANSACTIONS ON ELECTRON DEVICES(2024)

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摘要
In this work, we report a flexible doped hafnium oxide memcapacitor for building a noise-robust reservoir computing (RC) system. The nonlinearity and fading memory properties required for RC could be obtained from the capacitively coupled polarization switching and charge trapping in devices. The flexible oxide-based RC system shows a maximum accuracy of $\sim$ 91.4% in the music genres (GTZAN Genre Collection dataset) classification task. The high noise robustness of the system has been verified by adding different signal-to-noise ratios (SNRs) of environment noise (NOISEX-92 dataset) to the raw music. The accuracy remains over 87% even with an SNR of 0 dB with respect to six types of noises. Our results are expected to open up opportunities for flexible electronics with high computing capability.
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关键词
Hysteresis,Films,Noise robustness,Electrodes,Voltage,Task analysis,Reservoirs,Ferroelectric memcapacitor,flexible electronics,zirconium-doped hafnium oxide (HZO),neuromorphic computing,reservoir computing (RC)
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