Quantitatively predicting angle-resolved polarized Raman intensity of black phosphorus flakes

In-plane anisotropic layered materials (ALMs), such as black phosphorus (BP), exhibit unique angle-resolved polarized Raman (ARPR) spectroscopy characteristics, as attributed to birefringence, linear dichroism and complex Raman tensor. Moreover, the ARPR intensity profiles of BP flakes deposited on multilayer dielectrics are notably sensitive to their thickness, owing to interference effects. The intricate anisotropic effects present challenges in accurately predicting the ARPR intensity of BP flakes. In this study, we propose a comprehensive strategy for predicting the ARPR intensity of BP flakes by explicitly considering optical anisotropy, encompassing birefringence, linear dichroism, and anisotropic cavity interference effects within multilayered structures. Through this approach, we have identified the intrinsic complex Raman tensors for phonon modes, independent of the BP flake thickness. By leveraging this methodology, we have elucidated the flake thickness-dependent effective complex Raman tensor elements, allowing for precise prediction of the observed ARPR intensity profile for the BP flake. This work provides a profound understanding of ARPR behaviors for ALM flakes.