Dual profilometry based on Fourier single-pixel imaging using annular Fourier coefficient measurements

Optical profilometry based on single-pixel imaging allows for the digital three-dimensional (3D) reconstruction of objects even in the presence of interreflection and subsurface scattering, such as translucent objects. However, this method suffers from low efficiency due to the requirement for many measurements. For example, when using full -sampling Fourier single-pixel imaging, the necessary measurements of this method are up to twice the number of image pixels. To improve the measurement efficiency, this paper proposes a dual profilometry based on Fourier single-pixel imaging using annular Fourier coefficient measurements. The number of measurements required by the proposed method is much less than the number of image pixels. Experimental results demonstrate that by using 52 measurements of a standard ball without interreflection and subsurface scattering, the proposed method achieves a measurement accuracy of approximately 0.08 mm. The proposed method offers a solution for the high-efficiency 3D surface measurement affected by interreflection and subsurface scattering. The proposed method has potential application prospects in the engineering field.