LET Calibration of Ion Microbeams and Their SEE Cross-Section Characterisation

Stefania Peracchi, Ryan Drury,Zeljko Pastuovic, Jesse Williams,Linh T. Tran,Susanna Guatelli,Vladimir Pan, Jay W. Archer,Anatoly B. Rosenfeld,Andrea Coronetti,Natalia Emriskova,Ruben Garcia Alia,David Button,Michael Mann,David D. Cohen,Ceri Brenner

IEEE Transactions on Nuclear Science（2024）

Cited 0|Views36

Key words

Ions,Radiation effects,Silicon,Random access memory,Protons,Calibration,Energy measurement,Energy and linear energy transfer (LET) calibration,low-energy protons and heavy ions,microbeam,microdosimetry,single-event effects (SEEs) cross section

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