CHARM High-energy Ions for Micro Electronics Reliability Assurance (CHIMERA)

Kacper Bilko,Rubén García Alía,Alessandra Costantino,Andrea Coronetti,Salvatore Danzeca, Marc Delrieux,Natalia Emriskova,Matthew Alexander Fraser, Sylvain Girard, Eliott Philippe Johnson,Marc Sebban,Federico Ravotti, Andreas Waets

IEEE Transactions on Nuclear Science（2024）

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Abstract

We present the progress related to CERN’s capacity of delivering highly penetrating, high-LET heavy ions for radiation effect testing of electronic components within the CHIMERA (CHARM High-energy Ions for Micro Electronics Reliability Assurance) project. Profiting from the existing accelerator infrastructure, Monte Carlo simulations and a 300 μm-thick silicon diode, we highlight the beam characterization capabilities and a summary of the beam properties. Finally, we present the comparison of the SRAM SEE cross-section measurements with respect to other heavy ion facilities.

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Key words

CERN,High Energy Heavy Ions,Beam Characterisation,Single Event Effect (SEE),Single Event Upset (SEU),high Linear Energy Transfer (LET),Electronics testing,silicon,diode

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