Analysis of Total Ionizing Dose Effects Using Electron Holography

C. T. Chang,P. Apsangi,K. Muthuseenu,A. Privat, B. Kennedy,M. R. Mccartney, D. J. Smith,K. E. Holbert,H. J. Barnaby

IEEE TRANSACTIONS ON NUCLEAR SCIENCE（2024）

引用 0|浏览10

关键词

Electric potential,Holography,Semiconductor device measurement,Capacitance-voltage characteristics,Electrostatics,Charge measurement,Performance evaluation,Capacitors,electron holography,electrostatic potential,gamma-ray,metal-oxide-semiconductor (MOS),phase,radiation effects,total ionizing dose (TID)

AI 理解论文

溯源树

样例

生成溯源树，研究论文发展脉络

Chat Paper

正在生成论文摘要