Robust Single Divacancy Defects Near Stacking Faults in 4H-Sic under Resonant ExcitationZhen-Xuan He,Ji-Yang Zhou,Wu-Xi Lin,Qiang Li, Rui-Jian Liang,Jun-Feng Wang,Xiao-Lei Wen,Zhi-He Hao,Wei Liu, Shuo Ren,Hao Li,Li-Xing You,Jian-Shun Tang,Jin-Shi Xu,Chuan-Feng Li,Guang-Can GuoarXiv (Cornell University)（2024）引用 1|浏览28关键词High-Frequency ModelingAI 理解论文溯源树样例生成溯源树，研究论文发展脉络Chat Paper正在生成论文摘要
