GaN Atomic Electric Fields from a Segmented STEM Detector: Experiment and Simulation.
Journal of Microscopy（2024）
关键词
4D STEM,centre-of-mass,COM,electric fields,GaN,momentum-resolved STEM,segmented STEM detector
AI 理解论文
溯源树
样例
生成溯源树，研究论文发展脉络
Chat Paper
正在生成论文摘要