Design of microwave near-field imaging probe based on substrate integrated cavity

Near-field microwave scanning imaging technology is one of important applications of microwave measurement. We designed a probe for near-field microwave scanning imaging based on substrate integrated cavity (SIC), which operates in the 4.093 GHz band, by pairing with an independently-designed near-field scanning microwave imaging measurement system with the supporting host computer software. The word on a coin is photoed clearly and accurately.