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Combined Approach to the Calibration of a Single-Crystal Diffractometer. Studying the CsLiMo3O10 Structure in the Region from 90 K to 450 K

P. S. Serebrennikova, V. Y. Komarov, V. A. Trifonov,A. V. Panchenko,S. A. Gromilov

Journal of Structural Chemistry(2024)

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Abstract
We propose a number of approaches for refining unit cell parameters of single crystals using serial laboratory diffractometers equipped with 2D detectors and discuss the corresponding mathematical apparatus for processing the obtained results. The approaches are demonstrated on the example of orthorhombic LiCsMo3O10 crystals grown by the low-gradient Czochralski method using two different seed orientations but being identical in terms of the XRD analysis. It is shown that unit cell parameters of the crystals coincide within the estimated measurement error. The temperature dependence of unit cell parameters in the temperature range 90-450 K is studied, the view of the elements of the thermal expansion tensor is determined. The changes in the structural characteristics of LiCsMo3O10 in the studied temperature range are discussed.
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Key words
X-ray diffraction analysis,single-crystal diffractometer,2D detector calibration,diffraction data processing,goniometer calibration,accuracy of measuring unit cell parameters,high-temperature XRD.
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