Quantum Efficiency Measurement and Modeling of Silicon Sensors Optimized for Soft X-ray Detection
Maria Carulla,Rebecca Barten,Filippo Baruffaldi,Anna Bergamaschi,Giacomo Borghi,Maurizio Boscardin,Martin Brueckner,Tim A. Butcher,Matteo Centis Vignali,Roberto Dinapoli,Simon Ebner,Francesco Ficorella,Erik Froejdh,Dominic Greiffenberg,Omar Hammad Ali,Shqipe Hasanaj,Julian Heymes,Viktoria Hinger,Thomas King,Pawel Kozlowski,Carlos Lopez Cuenca,Davide Mezza,Konstantinos Moustakas,Aldo Mozzanica,Giovanni Paternoster,Kirsty A. Paton,Sabina Ronchin,Christian Ruder,Bernd Schmitt, Patrick Sieberer,Dhanya Thattil,Konrad Vogelsang, Xiangyu Xie,Jiaguo Zhang Sensors（2024）
Key words
soft X-ray sensors,entrance window,quantum efficiency
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