In-Memory Compute Chips with Carbon-based Projected Phase-Change Memory Devices

G. S. Syed,K. Brew,A. Vasilopoulos,V. P. Jonnalagadda,B. Kersting,T. Philip,V. Bragaglia,S. Ambrogio,J. Büchel, J. Giannopoulos,M. Le Gallo,C.-W. Cheng,M. BrightSky,V. Narayanan,N. Saulnier,A. Sebastian

2023 International Electron Devices Meeting (IEDM)（2023）

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关键词

Computational Memory,Impedance,Phase Change Materials,Standard Device,Projection Layer,Neural Network,Conductive,Deep Neural Network,Conductivity Values,Synaptic Weights,Deep Neural Network Layers,Neural Network Inference

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