A Novel FeFET Array-Based PUF: Co-optimization of Entropy Source and CRP Generation for Enhanced Robustness in IoT Security

2023 International Electron Devices Meeting (IEDM)(2023)

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Abstract
Enhancing the resistance of Physical Unclonable Function (PUF) to machine learning (ML) attacks while ensuring its reliability remains a critical challenge. In this work, we propose a novel strong PUF based on a 10×10 FeFET array, delivering high security, reliability, and reconfigurability. For the first time, the entropy source and CRP generation of PUF are co-optimized for robustness. We utilize the high variation in ferroelectric (FE) minor loop and high uniformity in major loop as reconfigurable static entropy source, then adopt non-linear Hamming distance comparison and window comparator for the generation of CPR. As a result, our approach reduces the accuracy of ML attacks by 20% compared to RRAM PUF, while keeping the raw bit error rate (BER) down to 1.7% at 100°C. Due to the high endurance of FeFETs, the capacity of reconfigurability reaches 1 × 10 8 . The PUF fits well for security applications due to its robustness and energy-efficiency.
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Key words
Entropy Source,Physical Unclonable Functions,Challenge-response Pairs,IoT Security,High Reliability,Bit Error Rate,Bit Error,High Uniformity,Stationary Sources,Major Loop,Intermediate State,Simulated Annealing,Linear Operator,Array Size,XOR Operation,Read Voltage,Ferroelectric Domain,Attack Success Rate,Intermediate Polarity
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