Spectral Responsivity and Photoresponse Non-Uniformity of a Perimeter-Gated Single-Photon Avalanche Diode Imager.

Fahimeh Dehghandehnavi, Md. Sakibur Sajal, Kai-Chun Lin,Marc Dandin

Midwest Symposium on Circuits and Systems(2023)

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摘要
In this paper we investigated the spectral responsivity and photoresponse non-uniformity (PRNU) of a perimeter-gated single-photon avalanche diode (pg-SPAD) imager fabricated in a 0.35 µm complementary metal-oxide semiconductor (CMOS) process. Our experimental results show that perimeter gating reduces the imager's mean room temperature dark count rate (DCR) by two orders of magnitude and that it expands pixel spectral responsivity over the visible range. Further, our results show that the PRNU's dependence on noise is significantly reduced in high perimeter gate voltage regimes.
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关键词
Single-photon avalanche diodes,perimeter gating,dark count rate,spectral responsivity,photoresponse non-uniformity,dark signal non-uniformity,fixed pattern noise,CMOS
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