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Micro-latch and Single Event Upset Phenomena Observed During Accelerated Atmospheric Neutron Testing of 40-90 Nm Commercial off the Shelf Static Random Access Memories

Matthew Barker,Keith Ryden,Alex Hands

2022 22ND EUROPEAN CONFERENCE ON RADIATION AND ITS EFFECTS ON COMPONENTS AND SYSTEMS, RADECS(2022)

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关键词
SRAM,COTS,SEE,SEU,SEL,micro-latch
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