Outcomes of post-implantation syndrome after endovascular repair for Stanford type B aortic dissection

Qingsong Wu,Jian He, Huangwei Li, Linfeng Xie, Wenxin Zeng,Xinfan Lin, Zhihuang Qiu,Liangwan Chen

Journal of Vascular Surgery(2024)

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摘要
•Type of research: Single-center retrospective cohort study•Key findings: Our findings suggested that emergency surgery, number of trunk stents more than one, procedure duration greater than 58.5 minutes, and amount of contrast medium greater than 75 mL demonstrate excellent predictive value for the assessment of PIS following TEVAR.•Take home message: PIS is relatively common after TEVAR. However, PIS was found to have little effect on early and late postoperative mortality or device-related complications.
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关键词
post-implantation syndrome,thoracic endovascular aortic repair,Stanford Type B aortic dissection,device-related complications,major adverse events
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