New Measurement of the Π0 [pi Superscript 0] Radiative Decay Width
I. Larin,D. McNulty,E. Clinton,P. Ambrozewicz,David Lawrence, C. Nattrass, D. Protopopescu,A. Teymurazyan,A. Ahmidouch, A.E. Asratyan, K.R. Baker,L. Benton, Aaron Bernstein, W. J. Briscoe, D. Branford,D. Dale,S. Danagoulian, G.V. Davidenko,R. Demirchyan,A. Deur,A. Dolgolenko,G.B. Dzyubenko, R. Ent, A. Evdokimov, J. H. Feng,M. Gabrielyan,L. Gan,A.P. Gasparian, S. R. Gevorkyan,A. Glamazdin,А. В. Канцырев,V. Gyurjyan, K.A. Hardy, Jun He, M. M. Ito, Lijun Jiang,D. Kashy,M. Khandaker,P. Kingsberry,A. Kolarkar,M. I. Konchatnij,A. Yu. Korchin, W. Korsch,S. Kowalski,M. Kubantsev,V. Kubarovsky, X. Li, P. P. Martel, V. Matveev, B. A. Mecking,Brian D. Milbrath,R. Minehart,R. Miskimen, В. В. Мочалов,S. Mtingwa,S. Overby,E. Pasyuk,M. Payen,R. Pedroni, B. G. Ritchie,T. E. Rodrigues,C. Salgado,A. Shahinyan,A. Sitnikov, D. I. Sober,S. Stepanyan,W. Stephens, Jonathan G. Underwood, A. N. Vasiliev, V.V. Vishnyakov, M. H. Wood, Shaojie Zhou
APS（2011）
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