Statistical Evaluation of the Mechanical and Flux Trapping Properties of Standard and Thin‐wall EuBCO(Ag) Bulk Superconductors

Josef Baumann,Michal Lojka,Anthony Dennis,Yunhua Shi,John H. Durrell,Tomas Hlasek,David A. Cardwell

JOURNAL OF THE AMERICAN CERAMIC SOCIETY（2024）

引用 0|浏览2

关键词

artificial holes,mechanical properties,microstructure,reinforcement,single grain bulk superconductors,tensile strength,thin-wall EuBCO(Ag),trapped field

AI 理解论文

溯源树

样例

生成溯源树，研究论文发展脉络

Chat Paper

正在生成论文摘要