Radiation Evaluation of LEON5FT/NOEL-VFT Demonstrator on STM 28nm-FDSOI Technology

Lucas Antunes Tambara, Jan Andersson, Ádria Barros de Oliveira,Fady Abouzeid, Magnus Hjorth,Philippe Roche

2023 European Data Handling & Data Processing Conference (EDHPC)（2023）

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摘要

The GR765 is a radiation-hardened octa-core fault-tolerant system-on-chip currently in development. This work presents the radiation evaluation of a test vehicle based on the same technology platform intended to be used in the GR765. Results show the effectiveness of the technology and processors' fault tolerance in handling soft errors.

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关键词

GR765,LEON,SPARC,NOEL-V,RISC-V,SEE,TID

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