The quality assurance test of the SliT ASIC for the J-PARC muon g-2/EDM experiment

The SliT ASIC is a readout chip for the silicon strip detector to be used at the J-PARC muon g-2/EDM experiment. The production version of SliT128D was designed and mass production was finished. A quality assurance test method for bare SliT128D chips was developed to provide a sufficient number of chips for the experiment. The quality assurance test of the SliT128D chips was performed and 5735 chips were inspected. No defect was observed in chips of 84.3 Accepting a few channels with poor time walk performance out of 128 channels per chip, more than 90 the whole detector.