Generic Arrays of Surface-Positioned and Shallow-Buried Gold Multi-Shapes As Reference Samples to Benchmark Near-Field Microscopes. Part 1: Applications in S-Snom Depth Imaging
RESULTS IN PHYSICS（2024）
Key words
Surface and sub-surface nanoscopy,In-depth evaluation,Generic prototypical samples,Near-field measurement techniques benchmarking,Numerical analysis,Easy process flow
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